The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Jul. 14, 2022
Thermo Electron Scientific Instruments Llc, Madison, WI (US);
Peter Steinberg, Hillsboro, OR (US);
Thermo Electron Scientific Instruments LLC, Madison, WI (US);
Abstract
A measurement system configured to examine a sample. The system comprises an internally reflective element, a contact member, an actuator, an optical assembly, a sensor, and a controller. The contact member and the reflective element are configured to apply a force to the sample. The optical assembly is configured to scan the sample. Whereby prior to the scan, an initial force is applied to the sample, and after the scan, a resulting force is applied to the sample. The sensor is configured to detect the resulting force applied to the sample, and the controller is configured to receive a signal from the sensor indicative of the detected resulting force. The controller is further configured to control the actuator to adjust the force applied to the sample by the contact member and the internally reflective element from the resulting force to the initial force.