The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
May. 22, 2019
Raytheon Company, Tewksbury, MA (US);
Stephen J. Schiller, La Mirada, CA (US);
Raytheon Company, Tewksbury, MA (US);
Abstract
A system () and method can monitor a reflectance of a mirror target that includes at least one curved mirror (M). The system () can take a first irradiance measurement of the sun (S), the first irradiance measurement representing a direct solar irradiance. The system () can take a second irradiance measurement that represents an irradiance from a reflection of the sun (S) from the mirror target plus background irradiance from a reflection of the sky from the mirror target. The system () can take a third irradiance measurement that represents the background irradiance from the reflection of the sky from the mirror target. The system () can determine a reflectance of the mirror target from the first, second, and third irradiance measurements. The system () can compare the reflectance to a specified reflectance threshold, and, upon determining that the reflectance of the mirror target is less than the specified reflectance threshold, can generate an alert signal.