The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Dec. 11, 2020
Beijing Rslaser Opto-electronics Technology Co., Ltd., Beijing, CN;
Guangyi Liu, Beijing, CN;
Rui Jiang, Beijing, CN;
Xiaoquan Han, Beijing, CN;
Jiangshan Zhao, Beijing, CN;
Pengfei Sha, Beijing, CN;
Qingqing Yin, Beijing, CN;
Hua Zhang, Beijing, CN;
Beijing RSLaserOpto-Electronics Technology Co. Ltd, Beijing, CN;
Abstract
According to the present disclosure, there is provided a device () and a method for measuring a wavelength for a laser device. The device () for measuring a wavelength for a laser device includes: a first optical path assembly and a second optical path assembly. The first optical path assembly and the second optical path assembly constitute a laser wavelength measurement optical path. The second optical path assembly includes: an FP etalon assembly () and an optical classifier (). The homogenized laser beam passes through the FP etalon assembly () to generate an interference fringe. The optical classifier () is arranged after the FP etalon assembly () in the laser wavelength measurement optical path, and configured to deflect the laser beam passing through the FP etalon assembly ().