The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Aug. 02, 2021
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Michitaka Okuta, Tokyo, JP;
Yuki Saito, Tokyo, JP;
Hisao Narita, Aomori, JP;
Shou Harako, Aomori, JP;
Jukiya Fukushi, Aomori, JP;
Tomokazu Saito, Aomori, JP;
Toshinaga Takeya, Aomori, JP;
Kabushiki Kaisha Nihon Micronics, Musashino, JP;
Abstract
A measurement method of receiving an emission light output from an optical semiconductor element on an incident end surface of an optical probe, shifts a relative position between the optical semiconductor element and the optical probe on a plane surface intersecting with an optical axis of the emission light, measures an incident intensity of the emission light at several positions, and obtains an incident intensity pattern showing a relationship between a change in the relative position and the respective incident intensities.