The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Jan. 06, 2022
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Jongmin Lee, Albuquerque, NM (US);
Grant Biedermann, Norman, OK (US);
Yuan-Yu Jau, Albuquerque, NM (US);
Michael Gehl, Edgewood, NM (US);
Christopher Todd DeRose, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
A guided cold-atom inertial sensor system comprises an atom trap integrated platform, a laser system, a magnetic field system, a control system, and a computing system. The laser system and magnetic field system are adapted to form a magneto-optical trap (MOT) about a suspended waveguide of the atom trap integrated platform made of membrane integrated photonics. After loading cold atoms from a MOT, the photonic atom trap integrated platform generates one-dimensional guided atoms with an evanescent field optical dipole trap (EF-ODT) along the optical waveguide to create guided atomic accelerometers/gyroscopes. Motion of atomic wavepackets in a superposition state is created along the guided atom geometry by way of state-dependent momentum kicks. The light-pulse sequence of guided atom interferometry splits, redirects, and recombines atomic wavepackets, which allows measurement of atom interference fringes sensitive to inertial forces via a probe laser.