The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Apr. 16, 2021
Henan Agricultural University, Zhengzhou, CN;
Qiaoyun Li, Zhengzhou, CN;
Guihong Yin, Zhengzhou, CN;
Haiyong Li, Zhengzhou, CN;
Yumei Jiang, Zhengzhou, CN;
Jishan Niu, Zhengzhou, CN;
Mengyu Li, Zhengzhou, CN;
Siyu Wang, Zhengzhou, CN;
Kaige Xu, Zhengzhou, CN;
Henan Agricultural University, Zhengzhou, CN;
Abstract
The present application discloses a method for rapidly identifying the resistance of wheat to black point disease caused by, where testing takes places in an indoor, controlled environment. The test method includes surface sterilization of wheat seeds, and cultivating wheat seedlings from the sterilized wheat seeds; preparing conidial suspension of, and spraying the conidial suspension on the seedlings at one-leaf-one-shoot stage; recording the percentage of the diseased leaf area in total leaf area of the first leaf of the wheat seedling on the 10day of inoculation; calculating the black point incidence of the wheat according to an equation, and then evaluating the resistance of wheat to black point disease caused bythrough the black point incidence. Compared with existing field identification methods, the method of the present disclosure shortens identification time, simplifies identification procedure, greatly improves identification efficiency, and improves the accuracy and reliability of identification results.