The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Dec. 08, 2021
Amazon Technologies, Inc., Seattle, WA (US);
Jose Luis De La Rosa, Seattle, WA (US);
Ting Xu, Kirkland, WA (US);
Duncan Pratt, Issaquah, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Disclosed are systems and methods for detecting defects during the handling and processing of items at a material handling facility. Embodiments of the present disclosure can be implemented at material handling to detect quality defects during processing of items in connection with fulfillment operations that may be designed to receive, store, sort, pick, pack, and ship items. Embodiments of the present disclosure provides a plurality of sensors and a trained machine learning model configured to provide real-time acquisition and analysis of item information to facilitate detection and mitigation of processing quality defects.