The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

May. 18, 2021
Applicant:

Chipone Technology (Beijing) Co., Ltd., Beijing, CN;

Inventors:

Zhenghua Lu, Beijing, CN;

Chenlong Man, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/13 (2022.01); G06F 21/32 (2013.01); G06V 10/75 (2022.01); G06V 40/12 (2022.01);
U.S. Cl.
CPC ...
G06V 40/1318 (2022.01); G06F 21/32 (2013.01); G06V 10/758 (2022.01); G06V 40/1353 (2022.01); G06V 40/1359 (2022.01); G06V 40/1376 (2022.01);
Abstract

Disclosed is a biometric information acquisition system and a processing method thereof. The biometric information acquisition system comprises a transparent substrate; a light source; a photoelectric conversion device, which is located at one side of the transparent substrate with the light source, receives light reflected by the transparent substrate and generates electrical signals; a processing device for obtaining biometric information based on the electrical signals. At least a portion of the transparent substrate is made of flexible material, and fits a predetermined portion of an organism on the other side of the transparent substrate based on a curved interface, therefore, ambient light incident to the photoelectric conversion device is reduced, an interference caused by the ambient light is reduced, accuracy of acquiring biometric characteristic information is improved. Because fitting with the curved interface can increase contact area, more biometric characteristic information of the predetermined portion can be obtained.


Find Patent Forward Citations

Loading…