The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

May. 30, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventor:

Motoharu Okuno, Fukuchiyama, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/25 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/254 (2013.01); G06T 7/60 (2013.01); G06T 7/97 (2017.01); G06T 11/00 (2013.01);
Abstract

This image processing system is provided with: a measurement part which measures the three-dimensional shape of a target object based on a captured image obtained by capturing an image of the target object; a reliability calculation part which calculates, for each area, an index that indicates the reliability in the measurement of the three-dimensional shape; a reliability evaluation part which evaluates, for each area, whether the calculated index satisfies a predetermined criterion; and a display part which simultaneously or selectively displays the measurement result of the three-dimensional shape and a result image that shows the area that does not satisfy the criterion in the captured image.


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