The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Feb. 11, 2021
Applicant:
Canon Medical Systems Corporation, Otawara, JP;
Inventors:
Murray Cutforth, Edinburgh, GB;
Ewan Hemingway, Edinburgh, GB;
Assignee:
CANON MEDICAL SYSTEMS CORPORATION, Otawara, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/20 (2017.01); A61B 5/00 (2006.01); A61B 5/055 (2006.01); A61B 8/06 (2006.01); A61B 8/08 (2006.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06T 7/143 (2017.01);
U.S. Cl.
CPC ...
G06T 7/20 (2013.01); A61B 5/055 (2013.01); A61B 5/7267 (2013.01); A61B 8/06 (2013.01); A61B 8/0891 (2013.01); A61B 8/488 (2013.01); G06T 7/0012 (2013.01); G06T 7/13 (2017.01); G06T 7/143 (2017.01); G06T 2207/10092 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30104 (2013.01);
Abstract
A medical image processing apparatus including processing circuitry configured to: obtain from medical imaging measurements, observations of one or more vector or tensor valued fields as projected from one or more 2D acquisition planes; use an optimisation procedure to determine from the observations a superset of 3D fields (which may be scalar, vector, or tensor) via a solution ansatz constrained by a system of partial differential equations, and output the plurality of these fields.