The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Feb. 23, 2021
Industrial Technology Research Institute, Hsinchu, TW;
Shang-Kun Li, Taichung, TW;
Shu Huang, Zhudong Township, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
An automatic bio-specimen inspection system includes an inspection device, an image processing module, a spatial learning module, a path generation module and a motion device. The inspection device is used to approach an inspection site for performing a bio-specimens collection and/or inspection. The image processing module is used to capture and process a plurality of 2D images of the inspection site. The spatial learning module is used to generate a 3D spatial information of the inspection site according to the 2D images. The path generation module is used to generate an inspection path information based on the 3D spatial information. The motion device is used to move the inspection device to the inspection site according to the inspection path information for performing the inspection operation.