The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Jun. 30, 2021
International Business Machines Corporation, Armonk, NY (US);
Zhuo Cai, Beijing, CN;
Chao Xin, Ningbo, CN;
Dan Zhang, Beijing, CN;
Hong Bing Zhang, Beijing, CN;
De Bo Xiong, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Technology for inspection for detecting a defect of a printed matter using machine logic informed by machine learning. Some embodiments of the present invention may include one, or more, of the following features: (i) generates defect datasets; (ii) generates defect libraries; (iii) uses the generated defect libraries for deep learning training; and (iv) uses machine learning to detect defects using computer code (for example, a *.jpg format file) corresponding to an image of a piece of printed matter instead of using a visual image (that is, an image of the type that is created when a person takes a picture using a traditional film camera).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile