The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Sep. 29, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Chun Lei Xu, Xi'an, CN;

Si Er Han, Xi'an, CN;

Shi Bin Liu, Xi'an, CN;

Yi Shao, Xi'an, CN;

Lei Tian, Xi'an, CN;

Hao Zheng, Xi'an, CN;

Jia Rui Wang, Xi'an, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/22 (2023.01); G06F 18/213 (2023.01); G06N 20/00 (2019.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/213 (2023.01); G06F 18/22 (2023.01); G06V 10/7715 (2022.01);
Abstract

Disclosed are a computer-implemented method, a system and a computer program product for feature processing. In the computer-implemented method for feature processing, two input features selected from multiple features of each sample in a sample set are projected to one resulting feature by one or more processing units based on a specified curve. The sample set is updated by replacing the two input features with the one resulting feature for each sample in the sample set by one or more processing units. The projecting and the updating for the sample set are repeated by one or more processing units until the number of features of each sample in the sample set reaches a predetermined criterion.


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