The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Jun. 17, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Abhishek Shah, Jersey City, NJ (US);

Ladislav Kunc, Cambridge, MA (US);

Haode Qi, Cambridge, MA (US);

Lin Pan, Acton, MA (US);

Saloni Potdar, Arlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/30 (2020.01); G06F 16/33 (2019.01); G06F 16/35 (2019.01); G06F 40/284 (2020.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); G10L 15/18 (2013.01); G06F 40/263 (2020.01); G06F 40/279 (2020.01); G06F 40/295 (2020.01); G06F 40/53 (2020.01);
U.S. Cl.
CPC ...
G06F 40/284 (2020.01); G06F 16/3344 (2019.01); G06F 16/355 (2019.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G10L 15/1822 (2013.01); G06F 40/263 (2020.01); G06F 40/279 (2020.01); G06F 40/295 (2020.01); G06F 40/53 (2020.01);
Abstract

A system for classifying a language sample intent by receiving a language sample including a set of features, identifying language sample features, determining a tokenization score for the language sample according to the language sample features, eliminating duplicate features according to the tokenization score, determining a term frequency (tf) according to the identified features and the tokenization score, determining an inverse document frequency (idf) according to the identified features and the tokenization score, and generating a term frequency-inverse document frequency (tf-idf) matrix for the identified features.


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