The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Dec. 30, 2018
Tableau Software, Inc., Seattle, WA (US);
Justin Talbot, Seattle, WA (US);
Roger Hau, Seattle, WA (US);
Daniel Cory, Seattle, WA (US);
Jiyoung Oh, San Carlos, CA (US);
Teresa Roberts, Palo Alto, CA (US);
Tableau Software, Inc., Seattle, WA (US);
Abstract
The method receives a visual specification, which specifies a data source, visual variables, and data fields from the data source. Each visual variable is associated with data fields and each data field is either a dimension or a measure. From an object model of the data source, the method identifies a minimal subtree that includes all of the dimension data fields and constructs a query from the minimal subtree. The method executes the query against the data source to retrieve a set of tuples, each tuple comprising a unique ordered combination of data values for the dimension data fields. For each tuple, the method forms an extended tuple by appending aggregated data values corresponding to each measure data field. The method then builds and displays a data visualization according to the data fields in the extended tuples and according to the visual variables to which the data fields are associated.