The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Jan. 22, 2021
Applicant:

Southeast University, Jiangsu, CN;

Inventors:

Ming Cheng, Jiangsu, CN;

Xinkai Zhu, Jiangsu, CN;

Wei Qin, Jiangsu, CN;

Zheng Wang, Jiangsu, CN;

Assignee:

SOUTHEAST UNIVERSITY, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01R 33/1253 (2013.01);
Abstract

A measurement apparatus includes an Epstein frame, an alternating power supply, a power analyzer, and an oscilloscope. Electromagnetic coupling modeling on an Epstein frame is performed based on a vector model of a magnetic circuit, where an iron core of the Epstein frame is formed by laminating a silicon steel sheet to be measured, and an excitation coil and a detection coil with the same turns number are wound around the iron core. The measurement process is to first obtain a reference B-H curve that only considers a nonlinear reluctance of the iron core, and then to derive a B-H curve considering an eddy current effect in a magnetic field at any frequency from the reference B-H curve. The method, applicable to a measurement for B-H curves at middle and high frequencies, may obtain much higher accuracy.


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