The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Feb. 04, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Shin Fujita, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/72 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8637 (2013.01); G01N 30/7233 (2013.01); G01N 2030/027 (2013.01);
Abstract

A peak analyzing method for separating overlapping peaks observed in a second signal waveform representing a relationship between a second parameter and a signal intensity into a plurality of individual peaks originating from different factors based on signal patterns observed in a dimension of a first parameter, the method including at least: performing singular value decomposition on an input matrix expressing three-dimensional data to be processed; estimating characteristic orientations within a space spanned by a plurality of basis vectors by performing a geometric analysis on a trajectory defined by a plurality of weighting vectors in an SVD projection space whose number of dimensions is equal to a lowered rank given by a singular value decomposition process; and deconvoluting signal waveforms in a first matrix of a dimension of the first parameter by a transformation matrix.


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