The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Oct. 30, 2020
Applicant:

Evident Corporation, Nagano, JP;

Inventors:

Mayumi Odaira, Akiruno, JP;

Yoshimasa Suzuki, Kawasaki, JP;

Assignee:

Evident Corporation, Nagano, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/45 (2006.01); G02B 26/10 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01); G01N 21/45 (2013.01); G02B 26/105 (2013.01); G02B 27/1013 (2013.01); G01N 2201/063 (2013.01);
Abstract

A data acquisition apparatus includes a light source, a first beam splitter, a predetermined beam splitter, a first light deflector, a second light deflector, a first measuring unit, a second measuring unit, a second beam splitter, and a photodetector. A second measurement optical path is positioned in a first direction and a reference optical path is positioned in a second direction. The predetermined beam splitter is disposed in the second measurement optical path or the reference optical path. A first measurement optical path is positioned between the predetermined beam splitter and the photodetector. The first light deflector and the first measuring unit are disposed in the first measurement optical path, and the second light deflector and the second measuring unit are disposed in the second measurement optical path. The first measurement optical path and the second measurement optical path intersect.


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