The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Mar. 04, 2021
Sysmex Corporation, Kobe, JP;
Yuki Shida, Kobe, JP;
Yukiko Nakamura, Kobe, JP;
Ken Nishikawa, Kobe, JP;
Kota Misawa, Kobe, JP;
Hikaru Onoue, Kobe, JP;
Takaaki Nagai, Kobe, JP;
Masaki Abe, Kobe, JP;
Takahito Mihara, Kobe, JP;
Masaharu Shibata, Kobe, JP;
Konobu Kimura, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
Disclosed is a cell classification method, to be executed by an analyzer, for classifying cells contained in a specimen, including: preparing a first measurement sample by treating a specimen under a first preparation condition; obtaining a first signal from the prepared first measurement sample; classifying, by using the first signal, cells contained in the first measurement sample; preparing a second measurement sample by treating the specimen under a second preparation condition different from the first preparation condition; obtaining a second signal from the prepared second measurement sample; classifying, by using the second signal, cells contained in the second measurement sample; and comparing a result of the cell classification performed by using the first signal and a result of the cell classification performed by using the second signal, with each other, and outputting an analysis result including a number of cells on the basis of a result of the comparison.