The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Jan. 31, 2023
Applicant:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Inventor:

Pierce O. Norton, Los Gatos, CA (US);

Assignee:

BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/1434 (2024.01); G01N 15/1429 (2024.01); G01N 15/149 (2024.01); G01N 15/01 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/1429 (2013.01); G01N 15/01 (2024.01); G01N 15/149 (2024.01);
Abstract

Systems having an unfiltered light scatter detector configured to detect scattered light from a sample in a flow stream are provided. Systems according to certain embodiments include a light source having two or more lasers, a light detection system having an unfiltered light scatter detector and a processor having memory operably coupled to the processor where the memory includes instructions which when executed by the processor, cause the processor to generate one or more data signals in response to scattered light from each of the two or more lasers detected by the unfiltered light scatter detector; and determine one or more parameters of data acquisition based on the generated data signals from the unfiltered light scatter detector. Methods for determining one or more parameters for data acquisition with the subject systems are also described.


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