The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Jul. 04, 2019
Adom, Advanced Optical Technologies Ltd., Lod, IL;
Yoel Cohen, Nes Ziona, IL;
Ra'anan Gefen, Modiin-Macabim-Reut, IL;
Shlomi Epstein, Jerusalem, IL;
Yoel Arieli, Jerusalem, IL;
Adom, Advanced Optical Technologies LTD., Lod, IL;
Abstract
Apparatus and methods are described for calibrating an optical system that is used for measuring optical properties of a portion of a subjects body. During a calibration stage, a front surface of a calibration object () is illuminated, light reflected from a plurality of points on the calibration object () is detected, and intensities of the light reflected from the plurality of points on the calibration object () are measured. During a measurement stage, the portion of the subjects body is illuminated, and light reflected from the portion of the subjects body is detected. Measurements performed upon the light that was reflected from the portion of the subjects body are calibrated, using the measured intensities of the light reflected from the plurality of points on the calibration object (). Other applications are also described.