The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Feb. 17, 2021
University of Southampton, Southampton, GB;
Touch Netix Limited, Fareham/Hampshire, GB;
Abstract
A method of measuring strain includes providing laminated material having ply layers, and a thickness along a direction orthogonal to the ply layers, and a strain sensor embedded between adjacent ply layers, wherein: the strain sensor includes first and second planar optical waveguide, each of the waveguides having a waveguiding core defining an optical propagation direction parallel to the laminated material and a Bragg grating in the waveguiding core, the optical propagation directions of the optical waveguides being non-parallel; interrogating the first optical waveguide Bragg grating with transverse electric (TE) and transverse magnetic (TM) polarized light, to obtain a TE spectral response and a TM spectral response; interrogating the second optical waveguide Bragg grating with TE and TM polarized light to obtain a TE spectral response and a TM spectral response; and processing the TE spectral responses and the TM spectral responses to extract a through-thickness component of strain.