The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Jul. 22, 2019
Applicant:

Donecle, Labege, FR;

Inventors:

Matthieu Claybrough, Toulouse, FR;

Alban Deruaz-Pepin, Balma, FR;

Josselin Bequet, Fonsorbes, FR;

Assignee:

DONECLE, Labege, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B64C 39/02 (2023.01); B64U 10/13 (2023.01); B64U 101/30 (2023.01); G01S 17/89 (2020.01); G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
B64C 39/024 (2013.01); G01S 17/89 (2013.01); G05D 1/0094 (2013.01); B64U 10/13 (2023.01); B64U 2101/30 (2023.01);
Abstract

The invention relates to a motorized flying craft () for measuring the contour of a plurality of regions of interest () of a surface of a predetermined object () to be inspected, said flying craft () comprising a carrier frame () and motorized means () for lifting and moving said carrier frame (). The flying craft is characterized in that it further comprises an apparatus () for three-dimensional measurement of a region of interest () targeted by said apparatus (), and a management system () of said craft configured to be able to switch said craft from a navigation mode, in which the craft can be moved from one region of interest to a subsequent region of interest, to a stabilized mode, in which said motorized lifting and movement means () are controlled so as to be able to keep at least one kinematic parameter of said craft constant, making it possible to minimize the vibration of said craft, and in which said measurement apparatus () can acquire a three-dimensional measurement of a region of interest.


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