The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Aug. 30, 2019
Applicant:

Nanyang Technological University, Singapore, SG;

Inventors:

Matteo Seita, Singapore, SG;

Tan-Phuc Le, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/205 (2017.01); B29C 64/386 (2017.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); G01B 11/30 (2006.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
B29C 64/386 (2017.08); B29C 64/205 (2017.08); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12); G01B 11/303 (2013.01); G06T 5/70 (2024.01); G06T 7/0004 (2013.01); G06T 2207/30144 (2013.01);
Abstract

There is provided a method of monitoring a powder bed process in additive manufacturing, using at least one processor. The method including: obtaining a first image of a powder bed layer from scanning the powder bed layer in a first scanning direction using a first contact image sensor, the powder bed layer being formed by a powder re-coater arm in the powder bed process and the first contact image sensor being attached to the powder re-coater arm; determining a focus level property of the first image; and detecting non-uniformities in the powder bed layer based on the focus level property of the first image. There is also provided a corresponding system for monitoring a powder bed process.


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