The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Mar. 13, 2023
Applicants:
Yoshihiro Oba, Miyagi, JP;
Ryosuke Kasahara, Kanagawa, JP;
Toshihide Sasaki, Kanagawa, JP;
Nobuto Hosono, Hyogo, JP;
Inventors:
Yoshihiro Oba, Miyagi, JP;
Ryosuke Kasahara, Kanagawa, JP;
Toshihide Sasaki, Kanagawa, JP;
Nobuto Hosono, Hyogo, JP;
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/145 (2013.01); A61B 5/0059 (2013.01);
Abstract
A measuring device includes a total internal reflection prism having a total reflection plane that an object to be measured contacts, a light source to emit light to make the light having a wavelength equal to or greater than 7 micrometers (μm) and equal to or less than 12 μm incident on the total reflection plane, and a sensor to detect light intensity of the light reflected by the total reflection plane. In the measuring device, an equation