The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Feb. 28, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Kuo Zhang, Dongguan, CN;

Lei Zhou, Shenzhen, CN;

Borui Li, Wuhan, CN;

Shengping Li, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0795 (2013.01);
Abstract

Embodiments of this application provide a method and an apparatus for obtaining a transmitter test parameter, and a storage medium. The method includes: performing waveform sampling on an optical signal sent by a transmitter, to obtain a sampled electrical signal, obtaining a first noise amount associated with the sampled electrical signal based on a preset initial noise ratio parameter and a level amplitude of the sampled electrical signal, and obtaining a second noise amount associated with an ideal electrical signal based on the initial noise ratio parameter and a level amplitude of the ideal electrical signal. According to the application, a noise amount associated with a level amplitude of a sampled electrical signal is obtained without limiting a type of a receiver that performs a consistency test on a transmitter by using a transmitter test parameter.


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