The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Feb. 06, 2023
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Sanquan Song, Los Altos, CA (US);

Stephen G. Tell, Chapel Hill, NC (US);

Nikola Nedovic, San Jose, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/099 (2006.01); H03L 7/089 (2006.01);
U.S. Cl.
CPC ...
H03L 7/099 (2013.01); H03L 7/0891 (2013.01);
Abstract

A glitch detection device includes an oscillator to generate multiple local clocks of multiple different phases and a sampling circuit to oversample, using the multiple local clocks, a system clock to generate multiple samples of the system clock. The device further includes digital logic that in turn includes a glitch detector to monitor a variation in pulse width of the system clock based on counting the multiple samples and to report a glitch in response to detecting a variation in the pulse width that exceeds a threshold value. The digital logic further includes a loop filter coupled between the glitch detector and the oscillator. The loop filter variably adjusts the oscillator based on a frequency of each of the multiple samples to control an output frequency of each of the multiple different phases of the oscillator.


Find Patent Forward Citations

Loading…