The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Aug. 07, 2019
Shimadzu Corporation, Kyoto, JP;
Yuki Ishikawa, Kyoto, JP;
Yusuke Tagawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A mass spectrometer according to one aspect of the present invention includes an ion source (), a mass separator (), and a detector (), the mass spectrometer further including: a parameter optimization unit () configured to optimize a parameter value using a Bayesian optimization method based on a result obtained by making measurements while changing values of device parameters including a plurality of parameters that affects ionization efficiency in the ion source (), a display processor () configured to display a sensitivity model which is a posterior distribution indicating a relationship between a plurality of parameters in all or some of the device parameters and signal strength estimated during the optimization of the device parameters, expressing as a graph like a heat map or an array of a plurality of the graphs on a display unit (), and to sequentially update the sensitivity model, and a file creation unit () configured to a user to designate a position on the displayed graph, and to create a method file containing a measurement condition used for sample measurement, based on a combination of values of parameters corresponding to the designated position.