The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

May. 12, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Kangwon Jeon, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2018.01); G09G 3/00 (2006.01); G09F 19/12 (2006.01); H04N 13/305 (2018.01); H04N 13/31 (2018.01);
U.S. Cl.
CPC ...
G09G 3/001 (2013.01); G09F 19/125 (2021.05); G09G 2320/02 (2013.01); G09G 2340/12 (2013.01); H04N 13/00 (2013.01); H04N 13/305 (2018.05); H04N 13/31 (2018.05);
Abstract

Provided is a method including: obtaining a plurality of images corresponding to a plurality of views; identifying at least one view region overlapping with a sub-pixel from among a plurality of view regions corresponding to the plurality of views; identifying a data value corresponding to the sub-pixel for each of at least one image corresponding to the at least one view region; determining an application degree of the data value for each of the at least one image, based on a level of overlap between the sub-pixel and the at least one view region, and determining an output value of the sub-pixel based on a data value adjusted according to the determined application degree; and outputting an image based on output values respectively determined for a plurality of sub-pixels including the sub-pixel.


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