The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
May. 05, 2021
Sherpa Space Inc., Daejeon, KR;
Choamun Yun, Daejeon, KR;
SHERPA SPACE INC., Daejeon, KR;
Abstract
The present disclosure relates to an image-based component measurement system using a light unit that outputs a variable wavelength, a method thereof, and a plant cultivation method using the same. More specifically, the present disclosure provides an image-based component measurement system using a light unit that outputs a variable wavelength, a method thereof, and a plant cultivation method using the same, which collect and analyze data based on image information acquired by emitting light having a specific wavelength using a sheet on which a plurality of quantum dots which can be controlled to have a wavelength necessary for measuring a configuration component of a target object are arranged. Thus, the system and methods are able to measure component content contained in the target object using a low cost and miniaturized device, and cultivate a plant by adjusting content of nutrients of the plant using the measured component content.