The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Mar. 19, 2018
Texas Instruments Incorporated, Dallas, TX (US);
Neeraj Bhardwaj, Karnataka, IN;
Neha Vernekar, Karnataka, IN;
Janardhan Venkata Raju, Bangalore, IN;
Shubham Mehrotra, Karnataka, IN;
Arun Adoni, Karnataka, IN;
Mahit Arun Warhadpande, Karnataka, IN;
Shimee Gupta, Bangalore, IN;
Goda Devi Addanki, Bangalore, IN;
Pavinkumar Ramasamy, Karnataka, IN;
Binoy Jose Maliakal, Karnataka, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Apparatuses and methods are disclosed for handling integrated circuits in automated testing. The handler apparatus includes an upper assembly that is selectively translatable above a testing surface and a lower bracket extending from and positioned below the upper assembly. The lower bracket forms a first opening, is selectively moveable upward and downward, and includes a rotatable finger extending downward to pick up and place an integrated circuit in a socket. The handier may further include an image sensor to detect potential error conditions, and a tool extending from the lower bracket to open and close a lid on the socket. The methods include sensing an image of an integrated circuit during certain phases of testing, analyzing the image to determine if the integrated circuit is positioned correctly, and correcting any detected error conditions before continuing with the automated testing.