The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

May. 13, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Bong Jun Ko, Harrington Park, NJ (US);

Christian Makaya, Yorktown Heights, NY (US);

Jorge J. Ortiz, Yorktown Heights, NY (US);

Swati Rallapalli, Ossining, NY (US);

Dinesh C. Verma, New Castle, NY (US);

Xiping Wang, Scarsdale, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/28 (2019.01); G06F 16/951 (2019.01); G06N 5/01 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/285 (2019.01); G06F 16/951 (2019.01); G06N 5/01 (2023.01); G06N 20/00 (2019.01);
Abstract

A provenance method, system, and non-transitory computer readable medium for a plurality of eidetic systems having logs, include crawling the logs of each node of a plurality of nodes of the eidetic systems to cluster segments across the logs of temporally correlated events into clustered segments and analyzing the correlated segments to interleave an order of processes in the logs and assign a probability to the order of the processes occurring.


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