The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Feb. 03, 2020
International Business Machines Corporation, Armonk, NY (US);
Jonathan Fry, Fishkill, NY (US);
Cheng-Tin Luo, Pleasant Valley, NY (US);
Cheng-Yi Lin, Hopewell Junction, NY (US);
Dureseti Chidambarrao, Weston, CT (US);
Jang Sim, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for production analysis includes: receiving production data at a processor from a plurality of tools spatially arranged within a manufacturing facility; creating a hierarchal topology of the data in the processor, wherein each level of the hierarchal topology is based on a different one of a plurality of static parameters that are selected from a list consisting of: a tool identifier, a batch identifier, and a spatial orientation; displaying, at a user interface implemented by the processor, a first analysis of a first level of the hierarchal topology, wherein the analysis contains parameters related to other levels of the hierarchal topology; receiving, via the user interface, a selection by a user of a first parameter displayed on the first analysis; and updating the user interface to display a second analysis of a second level of the hierarchal topology that is related to the first parameter.