The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Apr. 15, 2020
Dai Nippon Printing Co., Ltd., Tokyo, JP;
DAI NIPPON PRINTING CO., LTD., Tokyo, JP;
Abstract
An optical measurement device includes an optical system that focuses emitted light that is emitted from a measurement surface of a light emitting electronic display or a light emitting surface of which a speckle contrast or a sparkle contrast is to be measured; a two-dimensional sensor array having a two-dimensional sensor array surface on which the emitted light is focused, the two-dimensional sensor array capturing an image of the emitted light; and a calculation unit that calculates the speckle contrast or the sparkle contrast based on the image of the emitted light captured under an imaging condition under which a size of a light-emitting region on the measurement surface is constant, the light-emitting region contributing to formation of a diffraction limited spot of the emitted light on the two-dimensional sensor array surface.