The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Nov. 26, 2020
National Instruments Corporation, Austin, TX (US);
Jun Lu, Cedar Park, TX (US);
John George Banaska, Spicewood, TX (US);
Matthew Tate Dougan, Austin, TX (US);
Jeffrey Allan Cornell, Austin, TX (US);
Wendi Song, Shanghai, CN;
Xuechen Han, Shanghai, CN;
Kunal Harsad Patel, Cedar Park, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also for obtaining various parameters later used to derive an accurate VCSEL device voltage and an accurate VCSEL device current.