The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Nov. 30, 2018
Applicants:

Hitachi High-tech Corporation, Tokyo, JP;

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Daisuke Akieda, Tokyo, JP;

Takayuki Sugime, Tokyo, JP;

Izumi Ogata, Tokyo, JP;

Makoto Nogami, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/60 (2006.01); G01N 30/24 (2006.01); G01N 30/34 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/6043 (2013.01); G01N 30/24 (2013.01); G01N 30/34 (2013.01); G01N 30/7233 (2013.01);
Abstract

The analysis apparatus includes a standby section which is provided between a dispensing operation of an analysis item B′ prior to an analysis item C and the sample analysis channel introduction. The sample analysis channel introduction is arranged prior to a data collection section of an analysis item A. The operation is started earlier but after a sample dispensing operation section of the analysis item A. A sample dispensing operation section of the analysis item C can be started earlier and the analysis time of the analysis item C can be moved to immediately after a sample analysis operation section of the analysis item B′. The analysis item A in a second cycle can be started earlier by the early start time of the analysis item C in a first cycle. A total processing time Tc can be shorter than a total processing time Tb.


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