The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Mar. 06, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Hiroshi Ohashi, Kyoto, JP;

Takayuki Kihara, Kyoto, JP;

Hiroshi Miura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/00 (2006.01); G01N 30/32 (2006.01); G01N 30/88 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/32 (2013.01); G01N 30/88 (2013.01); G01N 2030/027 (2013.01); G01N 2030/8804 (2013.01);
Abstract

A liquid chromatograph is presented which enables automatic resolution of a liquid sending failure when the liquid sending failure caused by a liquid sending pump occurs, and execution of a new analysis with good reproducibility after the liquid sending failure is resolved. The liquid sending failure can be automatically resolved by a purging operation. A sample remaining in the analysis flow path is washed away by a non-injection analysis after the liquid sending failure is resolved, and a new analysis can be executed with good reproducibility.


Find Patent Forward Citations

Ohashi, Hiroshi. (2024). Liquid chromatograph with improved defect elimination (U.S. Patent No. 11959892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11959892

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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