The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

May. 19, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Shuhei Horita, Tokyo, JP;

Masafumi Tomono, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/8803 (2013.01); G01N 2021/8864 (2013.01); G01N 2021/888 (2013.01); G01N 2021/8887 (2013.01);
Abstract

Provided are a damage figure creation supporting apparatus, a damage figure creation supporting method, a damage figure creation supporting program, and a damage figure creation supporting system that enable efficient creation of a damage figure using marking colors. The damage figure creation supporting method includes a step of acquiring an image obtained by photographing a surface of a structure in color, a step of analyzing the acquired image and detecting markings applied to damaged portions on the surface of the structure for respective colors, and a step of creating a damage figure, based on detection results of the markings for the respective colors. The damage figure is configured as a diagram of tracing the markings and has a layered structure with layers each corresponding to a color.


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