The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Mar. 11, 2020
Applicant:

Nichirei Foods Inc., Tokyo, JP;

Inventors:

Kenji Fukumoto, Ritto, JP;

Takao Eto, Hachioji, JP;

Kazuro Ishiyama, Tokyo, JP;

Shinya Tsukamoto, Chiba, JP;

Assignee:

NICHIREI FOODS INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G 19/387 (2006.01); B65B 57/10 (2006.01); B65G 57/10 (2006.01); G01G 9/00 (2006.01);
U.S. Cl.
CPC ...
G01G 19/387 (2013.01); B65B 57/10 (2013.01); G01G 9/00 (2013.01);
Abstract

A combined weighing systemincludes a first X-ray inspection device, a combined weighing device, a bag making and packaging device, a weight inspection device, a second X-ray inspection device, and a management devicethat manages each device. The management devicerevises a weight conversion table of the first X-ray inspection deviceand a correction value of the combined weighing devicebased on an average value of weights of products B, which is calculated from a result of inspection over a certain time period in the weight inspection device


Find Patent Forward Citations

Loading…