The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Jun. 23, 2020
Applicant:

Bionano Genomics, Inc., San Diego, CA (US);

Inventors:

Michael G. Saghbini, San Diego, CA (US);

Henry B. Sadowski, San Diego, CA (US);

Goran Pljevaljcic, San Diego, CA (US);

Alex R. Hastie, San Diego, CA (US);

Han Cao, San Diego, CA (US);

Assignee:

Bionano Genomics, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6869 (2018.01); G16B 20/00 (2019.01); G16B 20/30 (2019.01);
U.S. Cl.
CPC ...
C12Q 1/6869 (2013.01); G16B 20/00 (2019.02); G16B 20/30 (2019.02);
Abstract

Methods of double-stranded nucleic acid sequence determination and assembly that are able to identify insertions, deletions, repeat region sizes and genomic rearrangements, for example, are disclosed herein, which can use relatively large labeled nucleic acid fragments to analyze the structure of even larger genetic regions. In some embodiments these methods involve the use of certain parameters which unexpectedly improve overall method performance. In some embodiments these methods involve sample labeling that does not result in the formation of single-stranded nucleic acid fragment labeling intermediaries.


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