The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Apr. 06, 2017
Applicant:

Metaboscreen Co., Ltd., Yokohama, JP;

Inventors:

Ryuichi Sekizawa, Yokohama, JP;

Ryoko Aso, Yokohama, JP;

Hiroshi Mitsutake, Yokohama, JP;

Assignee:

METABOSCREEN CO., LTD., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 7/00 (2006.01); C12M 1/00 (2006.01); G01N 1/42 (2006.01); G01N 1/44 (2006.01); G01N 21/64 (2006.01); G01N 21/84 (2006.01); B01L 3/00 (2006.01); B01L 9/00 (2006.01); C12Q 1/686 (2018.01);
U.S. Cl.
CPC ...
B01L 7/52 (2013.01); C12M 1/00 (2013.01); G01N 1/42 (2013.01); G01N 1/44 (2013.01); G01N 21/6428 (2013.01); G01N 21/645 (2013.01); G01N 21/6456 (2013.01); G01N 21/8483 (2013.01); B01L 3/502715 (2013.01); B01L 9/527 (2013.01); B01L 2200/025 (2013.01); B01L 2200/142 (2013.01); B01L 2200/147 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0636 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0819 (2013.01); B01L 2300/0861 (2013.01); B01L 2300/1822 (2013.01); B01L 2400/0406 (2013.01); C12Q 1/686 (2013.01);
Abstract

The thermocycling inspection device includes a holder-accommodating spacefor accommodating the chip holdertherein, a thermocycling sectionfor heating and cooling the inspection chip, and a detectorfor taking a picture of the inspection chip, and when the thermocycling sectionheats or cools or when a picture is taken by the detector, the thermocycling sectionis disposed on one side of the holder-accommodating space, the detectoris disposed on other side of the holder-accommodating space, and the holder-accommodating spaceis formed such that an optical axis of the detectorand a sample introducing portmatch with each other. According to this, polymerase chain reaction can be carried out, and inspection can be carried out using the inspection chip which carries out the polymerase chain reaction.


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