The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Apr. 28, 2019
Applicant:
Continuse Biometrics Ltd., Tel Aviv, IL;
Inventors:
Zeev Zalevsky, Rosh HaAyin, IL;
Sagi Polani, Tel-Aviv, IL;
Mark Golberg, Rehovot, IL;
Ran Califa, Givataym, IL;
Assignee:
CONTINUSE BIOMETRICS LTD., Tel Aviv, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/026 (2006.01); A61B 5/02 (2006.01); A61B 5/0285 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0261 (2013.01); A61B 5/02007 (2013.01); A61B 5/0285 (2013.01);
Abstract
The present invention relates to a novel optical approach based on spatial analysis of spatial laser speckle patterns for tissue in-depth flow inspection characteristics. In particular, the invention relates to a technique for determining flow characteristics and identifying low blood flow or a blockage in blood vessels.
Zalevsky, Zeev. (2024). System and method for depth flow inspection (U.S. Patent No. 11957441). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11957441
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile