The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Jul. 08, 2021
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Daisuke Utsunomiya, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); A61B 1/00 (2006.01); A61B 1/06 (2006.01); G06T 5/40 (2006.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
A61B 1/0638 (2013.01); A61B 1/000095 (2022.02); A61B 1/0005 (2013.01); A61B 1/0661 (2013.01); G06T 5/40 (2013.01); G06T 5/70 (2024.01);
Abstract
A picked-up image that is obtained from the image pickup of a subject illuminated with illumination light and auxiliary measurement light is acquired. The picked-up image includes at least two first and second spectral images having different wavelength components. A first arithmetic image from which a first noise component hindering the detection of an irradiation position of the auxiliary measurement light is removed by first arithmetic processing based on the first and second spectral images is obtained.