The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Sep. 06, 2019
Applicants:

Nec Corporation, Tokyo, JP;

National Cancer Center, Tokyo, JP;

Inventors:

Ikuma Takahashi, Tokyo, JP;

Maki Sano, Tokyo, JP;

Kimiyasu Takoh, Tokyo, JP;

Motoyasu Okutsu, Tokyo, JP;

Chiemi Tanaka, Tokyo, JP;

Masahiro Saikou, Tokyo, JP;

Hitoshi Imaoka, Tokyo, JP;

Kenichi Kamijo, Tokyo, JP;

Ryuji Hamamoto, Tokyo, JP;

Yutaka Saito, Tokyo, JP;

Masayoshi Yamada, Tokyo, JP;

Assignees:

NEC CORPORATION, Tokyo, JP;

NATIONAL CANCER CENTER, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 1/00 (2006.01); H04N 5/272 (2006.01);
U.S. Cl.
CPC ...
A61B 1/000094 (2022.02); A61B 1/0005 (2013.01); G06T 7/0012 (2013.01); H04N 5/272 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/30096 (2013.01);
Abstract

An information processing apparatus () detects an abnormal region () from a moving image frame (). The abnormal region () is a region that is estimated to represent an abnormal part inside a body of a subject. The information processing apparatus () generates and outputs output information based on the number of detected abnormal regions ().


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