The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Jun. 18, 2019
Applicant:

Interdigital Patent Holdings, Inc., Wilmington, DE (US);

Inventors:

Yugeswar Deenoo, Chalfont, PA (US);

Mouna Hajir, Montreal, CA;

J. Patrick Tooher, Montreal, CA;

Ghyslain Pelletier, Montreal, CA;

Paul Marinier, Brossard, CA;

Assignee:

InterDigital Patent Holdings, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/0816 (2024.01); H04W 72/0453 (2023.01); H04W 74/00 (2009.01); H04W 74/0833 (2024.01);
U.S. Cl.
CPC ...
H04W 74/0816 (2013.01); H04W 72/0453 (2013.01); H04W 74/008 (2013.01); H04W 74/0841 (2013.01);
Abstract

A WTRU may be configured to perform radio link monitoring (RLM) based on RLM reference signals (RLM-RSs) transmitted in a cell operating in an unlicensed spectrum. The WTRU may evaluate a radio link failure (RLF) status for the cell using a first RLM criteria based on the RLM-RSs. A transmission instance of the RLM-RSs may be skipped, for example, due to a listen before talk (LBT) failure at a gNodeB (gNB). The WTRU may adapt or change the first RLM criteria and/or evaluate the RLF status of the cell operating in the unlicensed spectrum using a second RLM criteria based on determining that the transmission instance of the RLM-RSs was skipped. The first RLM criteria may correspond to a first RLM process that utilizes a first set of RLM parameters. The second RLM criteria may correspond to a second RLM process that utilizes a second set of RLM parameters.


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