The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Sep. 07, 2020
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Yusuke Negoro, Osaka, JP;

Seiichi Yoneda, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/01 (2006.01); H01L 27/146 (2006.01); H04N 23/951 (2023.01); H10K 39/32 (2023.01);
U.S. Cl.
CPC ...
H04N 7/0135 (2013.01); H01L 27/14616 (2013.01); H04N 23/951 (2023.01); H10K 39/32 (2023.02); H01L 27/14643 (2013.01);
Abstract

An imaging system that has an image processing function and is capable of generating an interpolation image is provided. The imaging system has an additional function such as image processing and can generate an interpolation image by using image data output from an imaging device. The imaging device can perform filter processing in parallel during a light exposure period, and thus can perform a large amount of arithmetic operation and generate a high-quality interpolation image. The number of arithmetic operations can be further increased particularly during image capturing in a dark place, which requires a long exposure time. Accordingly, the frame rate can be substantially increased, and high-quality moving image data can be generated.


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