The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Jun. 01, 2021
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Hironobu Arimoto, Tokyo, JP;

Kazuya Makabe, Tokyo, JP;

Daisuke Fukui, Tokyo, JP;

Koki Takasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/031 (2006.01); H04N 1/03 (2006.01); H04N 1/191 (2006.01);
U.S. Cl.
CPC ...
H04N 1/0312 (2013.01); H04N 1/0306 (2013.01); H04N 1/191 (2013.01); H04N 2201/0081 (2013.01);
Abstract

The present disclosure relates to an image reading device having a highly-accurate structure that enables an easy increase in depth of field, that is, improvement in the depth of the field, without need for a change in basic characteristics of lenses. An overlap preventer () disposed between a lens array () and a sensor element array () to prevent overlap of images formed by lenses () is included. A slit section () that is the overlap preventer () includes multiple slit plates () arranged in a main scanning direction and extending in a sub-scanning direction to partition off a space, and the slit plates () are fixed to fixing plates ().


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