The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Aug. 27, 2021
Applicant:
Teledyne Lecroy, Inc., Thousand Oaks, CA (US);
Inventors:
Roger Delbue, Monroe, NY (US);
Patrick Connally, Suffern, NY (US);
Hitesh Patel, Pompton Lakes, NJ (US);
Gordon Getty, Santa Clara, CA (US);
Yann Oeffner, Signy, CH;
Assignee:
TELEDYNE LECROY, INC., Thousand Oaks, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 69/18 (2022.01); H04L 43/18 (2022.01); H04L 69/00 (2022.01);
U.S. Cl.
CPC ...
H04L 43/18 (2013.01); H04L 69/18 (2013.01); H04L 69/26 (2013.01); G06F 2218/02 (2023.01); G06F 2218/10 (2023.01);
Abstract
A method, system, and apparatus for simultaneous physical layer and protocol testing is provided that provides for simultaneous test of many layers of the communication stack at the same time, providing further measurement capability and insight into complex phenomena.