The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Oct. 13, 2021
Applicant:

Hangzhou Vango Technologies, Inc., Zhejiang, CN;

Inventors:

Yuyan Liu, Zhejiang, CN;

Siqi Wang, Zhejiang, CN;

Ling Lin, Zhejiang, CN;

Nick Nianxiong Tan, Zhejiang, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/02 (2006.01); H03H 17/06 (2006.01);
U.S. Cl.
CPC ...
H04L 25/0204 (2013.01); H03H 17/0671 (2013.01); H04L 25/022 (2013.01);
Abstract

A method, an apparatus and a device for simultaneously sampling multiples signals and a medium are provided. The method includes: modulating multiple target input signals with CDM, to obtain a single target analog signal; performing ΔΣ modulation on the single target analog signal to obtain a target digital bit stream; demodulating the target digital bit stream to obtain a target demodulated bit stream; and filtering the target demodulated bit stream to obtain multiple target output signals. With the method, the hardware overhead for simultaneous sampling of multiple-channel signals is reduced while ensuring accuracy. Accordingly, the apparatus and the device, and the medium have the above beneficial effects.


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