The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

May. 13, 2021
Applicant:

V-nova International Limited, London, GB;

Inventor:

David Handford, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 7/38 (2006.01); H03M 7/18 (2006.01); H03M 7/30 (2006.01); H03M 7/32 (2006.01); H04N 19/124 (2014.01); H04N 19/137 (2014.01); H04N 19/176 (2014.01); H04N 19/30 (2014.01); H04N 19/172 (2014.01); H04N 19/182 (2014.01);
U.S. Cl.
CPC ...
H03M 7/3062 (2013.01); H03M 7/18 (2013.01); H03M 7/3002 (2013.01); H04N 19/124 (2014.11); H04N 19/137 (2014.11); H04N 19/176 (2014.11); H04N 19/30 (2014.11); H04N 19/172 (2014.11); H04N 19/182 (2014.11);
Abstract

A first value of a first data element in a first set of data elements is obtained, the first set of data elements being based on a first time sample of a signal. A second value of a second data element in a second set of data elements is obtained, the second set of data elements being based on a second, later time sample of the signal. A measure of similarity is derived between the first value and the second value. Based on the derived measure, a quantisation parameter useable in performing quantisation on data based on the first time sample of the signal is determined. Output data is generated using the quantisation parameter.


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